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1μm Ultra High Resolution AOI Lens for Wafer Inspection

As the highest NA bi-telecentric lens on the market, the DTCA35F series allows for perfect color reproduction at 1μm resolution, setting a new standard in precision optics. This unparalleled capability ensures that the DTCA35F can match the resolution of an optical microscope while providing a greater working distance of 60 to 102mm.

Key Features:
– Achieve a maximum resolution of 1μm with a 7.5x magnification AOI lens.
– Benefit from a 0.2 NA for higher luminous flux and maximum resolution.
– Precise chromatic aberration correction ensures a focal shift of <0.043mm within the 460nm-650nm range.
– Enjoy variable light fields and compatibility with customized light sources.
– Experience highly uniform coaxial illumination, optimizing inspection accuracy and efficiency.

Poor Effect Excellent Imaging Quality

With its exceptional color fidelity and superior imaging quality, the DTCA35F series has garnered significant attention and accolades from customers. Its unrivaled design specifications make it a top choice for semiconductor inspections, offering enhanced detection precision for chips, OLEDs, MiniLEDs, and other applications.

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